The department Measurement and Performance Control is the Development and Engineering organization for the Product Group Applications.
The product group provides integrated solutions with computational, metrology and control technology for extendibility and improved efficiency of lithography products
Position in the Organization
The department Measurement & Performance Control (MPC) develops, delivers, integrates and
qualifies new functions and application packages in the area of wafer metrology (critical
dimensions, overlay and focus) and wafer fab applications (performance control applications).
All development activities need to be conducted in with the constraints of specification, time and
budget as demanded by market conditions Within MPC, the group YieldStar applications covers the area of physics and mathematics
development required to extract relevant metrics with required performance characteristics from the raw acquisitions, as well as the design, integration and test of new measurement functions
enabling the necessary applications on and meeting the usability criteria of the metrology tool.
In
addition the group is also responsible for the area of reticle marker design, enabling
measurement of specific lithographic parameters by means of YieldStar. |
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Specify, design, develop, realize, and test subsystems within the limits of system specifications, costs and project planning.
Area’s of development:
- algorithms in the area optimization techniques, sampling and interpolation
- wafer metrology in the framework of lithography
- performance improvements (technically and usability) of wafer measurements using scatterometry
Way of working:
- Cooperate with other disciplines and suppliers to ensure the timely realization of competitive, achievable and serviceable products, including their Product Information Documentation (PID).
- Participate in the definition of system specifications. Contribute to the overall broadening and maintenance of ASML’s technology base.
- Independently evaluate, select and apply standard engineering techniques, procedures and criteria, using judgment in making minor adaptations and modifications.
-Assignments have clear and specified objectives and require the investigation of limited number of variables. Consider other technical areas in devising solutions. It requires developmental
experience in a professional position. |
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Educational level
Master or Ph.D. in Physics / Mathematics / Electrical Engineering
- Knowledge of data analysis, statistics, modeling
Experience
0 - 2 years
- knowledge of semiconductor processes is a plus
- knowledge of metrology (microscopy, SEM, scatterometry) is a plus
- working in multifunctional teams
Other information
Development of functionality and applications compliant to the specific user conditions of
YieldStar at the different customer sites. Define requirements of new functional modules in YS as
well as tests and rolling out this functionality after implementation by SW. |
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